A de-embedding method based on combining time and frequency domains
Abstract This paper proposes an automatic fixture removal (AFR) de-embedding method to address the embedding error introduced by the fixture in radio frequency (RF) chip parameter testing and the cumbersome calibration process of the short-open-load-thru de-embedding method. The method uses the 2X-t...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-05-01
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| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-02785-3 |
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