SVD-Based Evaluation of Multiplexing in Multipinhole SPECT Systems

Multipinhole SPECT system design is largely a trial-and-error process. General principles can give system designers a general idea of how a system with certain characteristics will perform. However, the specific performance of any particular system is unknown before the system is tested. The develop...

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Bibliographic Details
Main Authors: Aaron K. Jorgensen, Gengsheng L. Zeng
Format: Article
Language:English
Published: Wiley 2008-01-01
Series:International Journal of Biomedical Imaging
Online Access:http://dx.doi.org/10.1155/2008/769195
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