Alotaibi, R., Nassar, M., Khan, Z. A., & Elshahhat, A. Analysis of reliability index R=P(Y<X) for newly extended xgamma progressively first-failure censored samples with applications. AIMS Press.
Chicago Style (17th ed.) CitationAlotaibi, Refah, Mazen Nassar, Zareen A. Khan, and Ahmed Elshahhat. Analysis of Reliability Index R=P(Y<X) for Newly Extended Xgamma Progressively First-failure Censored Samples with Applications. AIMS Press.
MLA (9th ed.) CitationAlotaibi, Refah, et al. Analysis of Reliability Index R=P(Y<X) for Newly Extended Xgamma Progressively First-failure Censored Samples with Applications. AIMS Press.
Warning: These citations may not always be 100% accurate.