Aspherical Surface Wavefront Testing Based on Multi-Directional Orthogonal Lateral Shearing Interferometry

To overcome the limitations of phase sampling points in testing aspherical surface wavefronts using traditional interferometers, we propose a high-spatial-resolution method based on multi-directional orthogonal lateral shearing interferometry. In this study, we provide a detailed description of the...

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Bibliographic Details
Main Authors: Yahui Zhu, Ailing Tian, Hongjun Wang, Bingcai Liu
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/24/23/7714
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