Aspherical Surface Wavefront Testing Based on Multi-Directional Orthogonal Lateral Shearing Interferometry
To overcome the limitations of phase sampling points in testing aspherical surface wavefronts using traditional interferometers, we propose a high-spatial-resolution method based on multi-directional orthogonal lateral shearing interferometry. In this study, we provide a detailed description of the...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-12-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/24/23/7714 |
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