APA (7th ed.) Citation

Tae, K., Cha, D., do, G., Lee, N., & Lee, S. Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors. IEEE.

Chicago Style (17th ed.) Citation

Tae, Kunhee, Danyoung Cha, Gyoungyeop do, Nayeong Lee, and Sungsik Lee. Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors. IEEE.

MLA (9th ed.) Citation

Tae, Kunhee, et al. Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors. IEEE.