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    Construction and application of march tests for pattern sensitive memory faults detection by V. N. Yarmolik, V. A. Levantsevich, D. V. Demenkovets, I. Mrozek

    Published 2021-03-01
    “…The urgency of the problem of testing storage devices of modern computer systems is shown. The mathematical models of their faults and the methods used for testing the most complex cases by classical march tests are investigated. …”
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