Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes by Samuel Parent, Frederic Vachon, Valerie Gauthier, Steve Lamoureux, Alexandre Paquette, Jacob Deschamps, Tommy Rossignol, Nicolas Roy, Philippe Arsenault, Henri Dautet, Serge A. Charlebois, Jean-Francois Pratte

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Charge-Based Compact Modeling of OECTs for Neuromorphic Applications by Ghader Darbandy, Malte Koch, Lukas M. Bongartz, Karl Leo, Hans Kleemann, Alexander Kloes

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Si Substrate Backside—An Emerging Physical Attack Surface for Secure ICs in Flip Chip Packaging by Makoto Nagata, Takuji Miki

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