Showing 1 - 5 results of 5 for search '"test pattern"', query time: 0.03s Refine Results
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    Noise‐based logic locking scheme against signal probability skew analysis by Ahmad Rezaei, Ali Mahani

    Published 2021-07-01
    Subjects: “…automatic test pattern generation…”
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    Article
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    New scan compression approach to reduce the test data volume by Pralhadrao V. Shantagiri, Rohit Kapur, Chandrasekar Shastry

    Published 2021-07-01
    Subjects: “…automatic test pattern generation…”
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    Article
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