Reduction in Temperature-Dependent Fiber-Optic Gyroscope Bias Drift by Using Multifunctional Integrated Optical Chip Fabricated on Pre-Annealed LiNbO₃ by Ercan Karagöz, Fatma Yasemin Aşık, Mutlu Gökkavas, Erkut Emin Akbaş, Aylin Yertutanol, Ekmel Özbay, Şadan Özcan

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Integrated PIN modulator and photodetector operating in the mid-infrared range from 5.5 μm to 10 μm by Nguyen Thi Hao Nhi, Turpaud Victor, Koompai Natnicha, Peltier Jonathan, Calcaterra Stefano, Isella Giovanni, Coudevylle Jean-René, Alonso-Ramos Carlos, Vivien Laurent, Frigerio Jacopo, Marris-Morini Delphine

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Plasmonic electro-optic modulators on lead zirconate titanate platform by Yezekyan Torgom, Thomaschewski Martin, Thrane Paul Conrad Vaagen, Bozhevolnyi Sergey I.

Subjects: “…electro-optic modulators…”
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High Efficiency Electro-Optic Modulation in a Graphene Silicon Hybrid Tapered Microring Resonator by Yonghua Wang, Lei Lei, Junbin Zang, Wenchan Dong, Xinliang Zhang, Ping Xu

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Analysis of SiN_x Waveguide-Integrated Liquid Crystal Platform for Wideband Optical Phase Shifters and Modulators by Pawaphat Jaturaphagorn, Nattaporn Chattham, Worawat Traiwattanapong, Papichaya Chaisakul

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Design of High-Speed Mid-Infrared Electro-Optic Modulator Based on Thin Film Lithium Niobate by Lingyun Yu, Jumei Shang, Kaiwen Luo, Qijing Lin, Huajiang Chen, Wentao Qiu, Heyuan Guan, Huihui Lu

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PSO-Aided Inverse Design of Silicon Modulator by Zijian Zhu, Yingxuan Zhao, Zhen Sheng, Fuwan Gan

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Three-Dimensional Optical-Electrical-Thermal Multi-Physical Analysis and Optimization in Thin Film Lithium Niobate Based Electro-Optic Modulator by Jing Chen, Jing Wang, Weiwen Zou

Subjects: “…Electro-optic modulator…”
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Electron‐Lattice Synergistic Coordination for Boosting the Electro‐Optic Response of the Crystal by Jinfeng Han, Yuzhou Wang, Fei Liang, Kui Wu, Dazhi Lu, Deliang Cui, Haohai Yu, Huaijin Zhang

Subjects: “…broadband electro‐optic modulation…”
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A Parallel Multi-channel Lithium Niobate Electro-optic Modulator by YANG Pengyi

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Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements by Kobe De Geest, Enes Lievens, Ewout Picavet, Klaartje De Buysser, Dries Van Thourhout, Jeroen Beeckman

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