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    In situ quantification of fungicide residue on wheat leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technology

    In situ quantification of fungicide residue on wheat leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technology by Xuerui Yang, Mengyao Shi, Minghui Hong, Zhixin Hui, Jiaqi Pan, Guangli Xiu, Lei Zhou

    Published 2025-01-01
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