Metrology of metasurfaces: optical properties by Nicolas Kossowski, Yanel Tahmi, Amir Loucif, Martin Lepers, Benoit Wattellier, Guillaume Vienne, Samira Khadir, Patrice Genevet

“…Here, we first review the existing optical metrology techniques previously used for metasurface inspection, including intensity, polarization, quantitative phase measurements, and ptychographic imaging. …”
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Optical Metrology under Extreme Conditions by Xide Li, Giancarlo Pedrini, Yu Fu

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Metrology Needs for Predicting Concrete Pumpability by Myoungsung Choi, Chiara F. Ferraris, Nicos S. Martys, Didier Lootens, Van K. Bui, H. R. Trey Hamilton

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METROLOGICAL PERFORMANCES OF BOMB CALORIMETERS AT REAL CONDITIONS by Yu. V. Maksimuk, Z. A. Antonava, V. S. Krouk, V. V. Fes’ko, V. N. Kursevich, A. F. Syshchanka, I. V. Vasarenko

“…In this work influence room temperature (Тк) and heat exchange conditions on metrological characteristics of two models of calorimeters is considered with different degree of thermal protection: V-08МА and BIC 100. …”
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METROLOGICAL MAINTENANCE OF MEASUREMENT OF THERMAL CONDUCTIVITY PARAMETERS by N. A. Zhagora, P. S. Serenkov, O. V. Fufaeva

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Metrological Advantages in Seeded and Lossy Nonlinear Interferometers by Jasper Kranias, Guillaume Thekkadath, Khabat Heshami, Aaron Z. Goldberg

“…We normalize the results based on the number of photons going through the sample that induces a phase shift on the incident quantum state, which eliminates some of the previously declared metrological advantages. We analyze the performance of nonlinear interferometers in a variety of geometries and robustness of the quantum advantage with respect to internal and external loss through direct comparison with a linear interferometer. …”
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METROLOGICAL MAINTENANCE OF SIMULATORS WITH MANY AMOUNTS OF FREEDOM by N. B. Sotsky

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Metrology with a twist: probing and sensing with vortex light by Mingjian Cheng, Wenjie Jiang, Lixin Guo, Jiangting Li, Andrew Forbes

“…Abstract Optical metrology is a well-established subject, dating back to early interferometry techniques utilizing light’s linear momentum through fringes. …”
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METROLOGICAL PERFORMANCE MODELING OF PROBE ELECTROMETERS CAPACITIVE SENSORS by A. K. Tyavlovsky, O. K. Gusev, A. L. Zharin

“…The obtained expression allows analyzing metrological characteristics of the circuit containing the dynamic capacitor at any values of its parameters. …”
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Quantum metrology using quantum combs and tensor network formalism by Stanisław Kurdziałek, Piotr Dulian, Joanna Majsak, Sagnik Chakraborty, Rafał Demkowicz-Dobrzański

Subjects: “…quantum metrology…”
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RETRACTED: Development of metrological support for measurement of physico-chemical quantities by Axmedov Gayrat, Masharipov Shodlik

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Impact of JPEG compression on the metrological characteristics of industrial CT data by Steffen Kieß, Robin Trostorf, Hieu Tran, Jajnabalkya Guhathakurta, Sven Simon, Ulrich Neuschaefer-Rube

“… The basis of metrology with computed tomography (CT) are volume datasets with increasing sizes in the two- or three-digit GB range due to the increasing detector resolutions in the double-digit MPixel range. …”
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Infinitesimal optical singularity ruler for three-dimensional picometric metrology by Haixiang Ma, Yuquan Zhang, Jiakang Zhou, Fu Feng, Michael G. Somekh, Changjun Min, Xiaocong Yuan

“…Abstract Optical metrology with picometer-scale precision in three-dimensional space is of considerable importance in modern physics and state of the art technology, optical interference is an effective method, but techniques with rapid spatial variation have the potential to enhance measurement precision, which will be required as measurement dimensions decrease. …”
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Measurement of wettability and surface roughness for metrology and quality control in microfluidics by Daugbjerg Thomas Schrøder, Crouzier Loïc, Delvallée Alexandra, Ogheard Florestan, Pecnik Christina, Romieu Kevin, Saraiva Fernanda, Batista Elsa

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Metrological studies of the characteristics of multilayer surface coatings using synchrotron radiation by A. S. Sigov, O. A. Minaeva, S. I. Anevsky, A. M. Lebedev, R. V. Minaev

“…It plays an important role in nanoelectronics metrological base. The main research were carried out at electron storage rings «Siberia-1» (Kurchatov Institute) and MLS (PTB, Berlin) with low electron energy, in a wide wavelength range, including visible range, AUV, VU, EUV and to exclude the X-ray radiation influence. …”
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Diamond Color Center Based Quantum Metrology in Industries for Energy Applications by Tanmoy Basu, Anupam Patra, Midhun Murali, Mahesh Saini, Amit Banerjee, Tapobrata Som

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METROLOGICAL MODELING OF DIMENSIONAL OPERATIONAL INSPECTION PROCESSES AS AN INSTRUMENT OF RELIABILITY ASSURANCE by D. V. Solomakho

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Design of an Inhalation Chamber and Metrology Assessment to Study Tungsten Aerosol Neurotoxic Effects by Léo Macé, Chrystelle Ibanez, Thomas Gelain, Cécile Bodiot, Laure Juhel, François Gensdarmes

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Realization of Versatile and Effective Quantum Metrology Using a Single Bosonic Mode by Xiaozhou Pan, Tanjung Krisnanda, Andrea Duina, Kimin Park, Pengtao Song, Clara Yun Fontaine, Adrian Copetudo, Radim Filip, Yvonne Y. Gao

“…Quantum metrology offers the potential to surpass its classical counterpart, pushing the boundaries of measurement precision toward the ultimate Heisenberg limit. …”
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The Research Progress of Single-Molecule Sequencing and Its Significance in Nucleic Acid Metrology by Yajun Wang, Jingjing Liu, Zhendong Wang, Mei Zhang, Yongzhuo Zhang

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