Perspective on the development of XPS and the pioneers who made it possible by D. R. Baer, P. M. A. Sherwood

“…Included is information about the early development of photoelectron spectroscopy, the seminal work of Kai Siegbahn, influential conferences that helped spread excitement and provide a fundamental understanding of the method, early development of commercial instruments, and identification of the need for systematic metrology. Because hundreds of researchers have contributed to advancing the method, we note that this is our perspective, with likely a different emphasis than others may have chosen. …”
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Extended Kalman Filter-Based Approach for Autonomous Synchronization and Ranging in GPS-Denied Environments by Xiaobo Gu, Weiqiang Tan, Di Zhang, Yudong Lu, Ruidian Zhan

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EQUIPMENT FOR NONDESTRUCTIVE TESTING OF SILICON WAFERS SUBMICRON TOPOLOGY DURING THE FABRICATION OF INTEGRATED CIRCUITS by S. A. Chizhik, S. P. Basalaev, V. A. Pilipenko, A. L. Khudoley, T. A. Kuznetsova, V. V. Chikunov, A. A. Suslov

“…Complex  SPM  200  realizes  nondestructive control of microelectronics elements made on silicon wafers up to 200 mm in diameter and it is introduced by JSC «Integral» for the purpose of operational control, metrology and acceptance of the final product.…”
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Analysis of geometric structure of woven fabrics surface. by Gabriela Kosiuk, Małgorzata Matusiak

“…Surface topography measurements were performed using the MicroSpy® Profile profilometer by FRT the art of metrology™. Using the Mark III software cooperating with the profilometer, a number of indices characterizing the geometric structure of the fabric surface and histograms illustrating the frequency of occurrence of points of a certain height on the tested surface were determined. …”
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Diffusion coefficients in multiphase Ni80Cr20-Ti system by Wierzba B., Serafin D., Nowak W.J., Wierzba P., Ciećko A., Mazurkow A.

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Terahertz Harmonic Operation of Microwave Fresnel Zone Plate Lens and Antenna: Frequency Filtering and Space Resolution Properties by Hristo D. Hristov

“…High-order harmonic operation of the FZP lens or lens antenna could find space resolution and frequency filtering applications in the terahertz and optical metrology, imaging tomography, short-range communications, spectral analysis, synchrotron facilities, and so on.…”
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Effect of Embroidery Style on the Bandwidth of Textronic RFID UHF Transponder Antenna by Magdalena Nizioł, Piotr Jankowski-Mihułowicz, Mariusz Węglarski

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Rotating Machine Fault Diagnosis Based on Optimal Morphological Filter and Local Tangent Space Alignment by Shaojiang Dong, Lili Chen, Baoping Tang, Xiangyang Xu, Zhengyuan Gao, Juan Liu

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Quantum magnetometry of transient signals with a time resolution of 1.1 nanoseconds by K. Herb, L. A. Völker, J. M. Abendroth, N. Meinhardt, L. van Schie, P. Gambardella, C. L. Degen

“…Looking forward, adding fast temporal resolution to the spatial imaging capability further promotes single-spin probes as powerful research tools in spintronics, mesoscopic physics, and nanoscale device metrology.…”
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Fabrication of periodically poled lithium niobate waveguides for broadband nonlinear photonics by Furkan Ayhan, Markus Ludwig, Tobias Herr, Victor Brasch, Luis Guillermo Villanueva

“…Nonlinear optics is the precursor for many of the modern-day applications of photonics, including femtosecond pulse synthesis, precision spectroscopy, and metrology. In the last decade, nanophotonic waveguides have not only boosted the efficiencies of nonlinear effects but also unlocked new degrees of freedom in the design process and enabled the monolithic integration of multiple nonlinear devices. …”
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Morphology of Near- and Semispherical Melted Chips after the Grinding Processes Using Sol-Gel Abrasives Based on SEM-Imaging and Analysis by W. Kapłonek, K. Nadolny, W. Habrat

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Socio-psychological risks of different generations in the digitalisation of society by V. N. Voronin, M. V. Iontseva, L. Yu. Shuraeva

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Predicting EV battery state of health using long short term degradation feature extraction and FEA TimeMixer by Weijie Tang, Jiayan Chen, Dongjiao Chen

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Ordinal Analysis of Variation of Sensory Responses in Combination with Multinomial Ordered Logistic Regression vs. Chemical Composition: A Case Study of the Quality of a Sausage fr... by Tamar Gadrich, Francesca R. Pennecchi, Ilya Kuselman, D. Brynn Hibbert, Anastasia A. Semenova, Pui Sze Cheow

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The introduction of the metric system of weights and measures in the Omsk district in the 1920s by I. V. Makarov

“…The article is devoted the process metric reform of the 1920s, which is one of the most important parts of the history of Russian and Siberian metrology and an integral part of the socio-economic modernization of the USSR, in the Omsk district. …”
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Effect of Dissimilatory Iron Reduction on the Reduction of CH4 Production in Landfill Conditions by Lifang Hu, Yuyang Long, Chengran Fang

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Spectroscopy and Modeling of ^{171}Yb Rydberg States for High-Fidelity Two-Qubit Gates by Michael Peper, Yiyi Li, Daniel Y. Knapp, Mila Bileska, Shuo Ma, Genyue Liu, Pai Peng, Bichen Zhang, Sebastian P. Horvath, Alex P. Burgers, Jeff D. Thompson

“…This work establishes a solid foundation for the continued development of quantum computing, simulation, and entanglement-enhanced metrology with Yb neutral atom arrays.…”
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A new method for describing the change of the laser beam axis trajectory in the Anderson differential cuvette to measure the refractive index of liquids by V.V. Davydov, D.S. Provodin, A.A. Gol’dberg, I.D. Kochetkov

“…Directions of research for the further error reduction are outlined, that would allow the developed refractometer design to be used in scientific research and as a verification scheme in metrology.…”
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GA Based Adaptive Singularity-Robust Path Planning of Space Robot for On-Orbit Detection by Jianwei Wu, Deer Bin, Xiaobing Feng, Zhongpu Wen, Yin Zhang

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iDIA-QC: AI-empowered data-independent acquisition mass spectrometry-based quality control by Huanhuan Gao, Yi Zhu, Dongxue Wang, Zongxiang Nie, He Wang, Guibin Wang, Shuang Liang, Yuting Xie, Yingying Sun, Wenhao Jiang, Zhen Dong, Liqin Qian, Xufei Wang, Mengdi Liang, Min Chen, Houqi Fang, Qiufang Zeng, Jiao Tian, Zeyu Sun, Juan Xue, Shan Li, Chen Chen, Xiang Liu, Xiaolei Lyu, Zhenchang Guo, Yingzi Qi, Ruoyu Wu, Xiaoxian Du, Tingde Tong, Fengchun Kong, Liming Han, Minghui Wang, Yang Zhao, Xinhua Dai, Fuchu He, Tiannan Guo

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