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    Design, Simulation, and Experimental Verification of a Destruction Mechanism of Transient Electronic Devices by Yu Xiao, Zhengyuan Zhang, Xiyi Liao, Feiyu Jiang, Yan Wang

    Published 2020-01-01
    “…The simulation and experimental results confirm the feasibility of the structure in quick destruction, which lays the foundation for developing instantaneous-failure integrated circuit products to meet information security applications.…”
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    Article
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