THE USE OF SCANNING PROBE MICROSCOPY FOR THE ASSESSMENT OF CHILDREN’S PERIPHERAL LEVEL ERYTHRON by Tatyana Petrovna Bondar, Evgeniy Aleksandrovich Melchenko

Subjects: “…сканирующая зондовая микроскопия…”
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Study on mechanical and microgeometric characteristics of ion-plasma deposited TiN coating on 40Cr steel substrate by Evgeniy V Sadyrin, Boris I. Mitrin, Leonid I. Krenev, Sergey M. Aizikovich

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