Han, X., Yu, D., Chen, C., & Dai, K. Failure behavior of tantalum electrolytic capacitors under extreme dynamic impact: Mechanical–electrical model and microscale characterization. AIP Publishing LLC.
Chicago Style (17th ed.) CitationHan, Xiangyu, Da Yu, Cheng Chen, and Keren Dai. Failure Behavior of Tantalum Electrolytic Capacitors Under Extreme Dynamic Impact: Mechanical–electrical Model and Microscale Characterization. AIP Publishing LLC.
MLA (9th ed.) CitationHan, Xiangyu, et al. Failure Behavior of Tantalum Electrolytic Capacitors Under Extreme Dynamic Impact: Mechanical–electrical Model and Microscale Characterization. AIP Publishing LLC.
Warning: These citations may not always be 100% accurate.