CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples

Images taken by transmission electron microscopes are usually affected by lens aberrations and image defocus, among other factors. These distortions can be modeled in reciprocal space using the contrast transfer function (CTF). Accurate estimation and correction of the CTF is essential for restoring...

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Main Authors: Johannes Elferich, Lingli Kong, Ximena Zottig, Nikolaus Grigorieff
Format: Article
Language:English
Published: eLife Sciences Publications Ltd 2024-12-01
Series:eLife
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Online Access:https://elifesciences.org/articles/97227
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_version_ 1846114336247906304
author Johannes Elferich
Lingli Kong
Ximena Zottig
Nikolaus Grigorieff
author_facet Johannes Elferich
Lingli Kong
Ximena Zottig
Nikolaus Grigorieff
author_sort Johannes Elferich
collection DOAJ
description Images taken by transmission electron microscopes are usually affected by lens aberrations and image defocus, among other factors. These distortions can be modeled in reciprocal space using the contrast transfer function (CTF). Accurate estimation and correction of the CTF is essential for restoring the high-resolution signal in cryogenic electron microscopy (cryoEM). Previously, we described the implementation of algorithms for this task in the cisTEM software package (Grant et al., 2018). Here we show that taking sample characteristics, such as thickness and tilt, into account can improve CTF estimation. This is particularly important when imaging cellular samples, where measurement of sample thickness and geometry derived from accurate modeling of the Thon ring pattern helps judging the quality of the sample. This improved CTF estimation has been implemented in CTFFIND5, a new version of the cisTEM program CTFFIND. We evaluated the accuracy of these estimates using images of tilted aquaporin crystals and eukaryotic cells thinned by focused ion beam milling. We estimate that with micrographs of sufficient quality CTFFIND5 can measure sample tilt with an accuracy of 3° and sample thickness with an accuracy of 5 nm.
format Article
id doaj-art-fb382d0f34894af2965b0fbe5dcd01bf
institution Kabale University
issn 2050-084X
language English
publishDate 2024-12-01
publisher eLife Sciences Publications Ltd
record_format Article
series eLife
spelling doaj-art-fb382d0f34894af2965b0fbe5dcd01bf2024-12-20T14:11:12ZengeLife Sciences Publications LtdeLife2050-084X2024-12-011310.7554/eLife.97227CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samplesJohannes Elferich0https://orcid.org/0000-0002-9911-706XLingli Kong1https://orcid.org/0000-0002-5808-2649Ximena Zottig2https://orcid.org/0000-0002-2344-5163Nikolaus Grigorieff3https://orcid.org/0000-0002-1506-909XRNA Therapeutics Institute, University of Massachusetts Chan Medical School, Worcester, United States; Howard Hughes Medical Institute, University of Massachusetts Chan Medical School, Worcester, United StatesRNA Therapeutics Institute, University of Massachusetts Chan Medical School, Worcester, United StatesRNA Therapeutics Institute, University of Massachusetts Chan Medical School, Worcester, United States; Howard Hughes Medical Institute, University of Massachusetts Chan Medical School, Worcester, United StatesRNA Therapeutics Institute, University of Massachusetts Chan Medical School, Worcester, United States; Howard Hughes Medical Institute, University of Massachusetts Chan Medical School, Worcester, United StatesImages taken by transmission electron microscopes are usually affected by lens aberrations and image defocus, among other factors. These distortions can be modeled in reciprocal space using the contrast transfer function (CTF). Accurate estimation and correction of the CTF is essential for restoring the high-resolution signal in cryogenic electron microscopy (cryoEM). Previously, we described the implementation of algorithms for this task in the cisTEM software package (Grant et al., 2018). Here we show that taking sample characteristics, such as thickness and tilt, into account can improve CTF estimation. This is particularly important when imaging cellular samples, where measurement of sample thickness and geometry derived from accurate modeling of the Thon ring pattern helps judging the quality of the sample. This improved CTF estimation has been implemented in CTFFIND5, a new version of the cisTEM program CTFFIND. We evaluated the accuracy of these estimates using images of tilted aquaporin crystals and eukaryotic cells thinned by focused ion beam milling. We estimate that with micrographs of sufficient quality CTFFIND5 can measure sample tilt with an accuracy of 3° and sample thickness with an accuracy of 5 nm.https://elifesciences.org/articles/97227cryoEMelectron microscopycontrast transfer functionsample quality
spellingShingle Johannes Elferich
Lingli Kong
Ximena Zottig
Nikolaus Grigorieff
CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples
eLife
cryoEM
electron microscopy
contrast transfer function
sample quality
title CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples
title_full CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples
title_fullStr CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples
title_full_unstemmed CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples
title_short CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples
title_sort ctffind5 provides improved insight into quality tilt and thickness of tem samples
topic cryoEM
electron microscopy
contrast transfer function
sample quality
url https://elifesciences.org/articles/97227
work_keys_str_mv AT johanneselferich ctffind5providesimprovedinsightintoqualitytiltandthicknessoftemsamples
AT linglikong ctffind5providesimprovedinsightintoqualitytiltandthicknessoftemsamples
AT ximenazottig ctffind5providesimprovedinsightintoqualitytiltandthicknessoftemsamples
AT nikolausgrigorieff ctffind5providesimprovedinsightintoqualitytiltandthicknessoftemsamples