A SET‐tolerant StrongARM comparator with improved performance

Abstract In this paper, a radiation hardened by design StrongARM comparator is proposed to mitigate the radiation effects. With 12 additional transistors compared to the conventional one, the proposed structure shows much higher immunity to single‐event transients. During the amplification phase, wh...

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Bibliographic Details
Main Authors: Chentian Zhou, Yuanyuan Han, Xu Cheng, Xiaoyang Zeng
Format: Article
Language:English
Published: Wiley 2024-12-01
Series:Electronics Letters
Subjects:
Online Access:https://doi.org/10.1049/ell2.70094
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