Interface dipole evolution from the hybrid coupling between nitrogen-doped carbon quantum dots and polyethylenimine featuring the electron transport thin layer at Al/Si interfaces
The assessment of electron transport layer (ETL) for rear-contact engineering of silicon (Si) based optoelectronics has been considered as one of the critical challenges that leverage the performance improvement and device reliability. In this work, the hybrid design of ETL, obtained from the soluti...
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Main Authors: | Sasimontra Timjan, Ta-Cheng Wei, Kuan-Han Lin, Yi-Ting Li, Po-Hsuan Hsiao, Chia-Yun Chen |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2025-01-01
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Series: | Applied Surface Science Advances |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2666523924000941 |
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