Kim, B., Shin, M., & Hwang, S. Design and Development of a Precision Defect Detection System Based on a Line Scan Camera Using Deep Learning. MDPI AG.
Chicago Style (17th ed.) CitationKim, Byungcheol, Moonsun Shin, and Seonmin Hwang. Design and Development of a Precision Defect Detection System Based on a Line Scan Camera Using Deep Learning. MDPI AG.
MLA (9th ed.) CitationKim, Byungcheol, et al. Design and Development of a Precision Defect Detection System Based on a Line Scan Camera Using Deep Learning. MDPI AG.
Warning: These citations may not always be 100% accurate.