Measurement of the insensitive surface layer thickness of a PIN photodiode based on alpha-particle spectrometry
In this work, the insensitive layer thickness of a PIN photodiode (SFH206K - Osram) has been measured by varying the incident angle of a collimated monoenergetic alpha particle beam. This technique is based on the fact that, except for the intrinsic uncertainties of the emission and straggling of al...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)
2022-12-01
|
| Series: | Brazilian Journal of Radiation Sciences |
| Subjects: | |
| Online Access: | https://bjrs.org.br/revista/index.php/REVISTA/article/view/1789 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|