APA (7th ed.) Citation

Zhang, X., Xie, Y., Liu, B., Meng, Y., Sun, K., Wu, G., & Tan, J. Rapid analysis of temperature fields in electronic enclosures based on the finite difference thermal resistance network method. Elsevier.

Chicago Style (17th ed.) Citation

Zhang, Xiaoyue, Yinmo Xie, Bing Liu, Yingze Meng, Kewei Sun, Guangsheng Wu, and Jianyu Tan. Rapid Analysis of Temperature Fields in Electronic Enclosures Based on the Finite Difference Thermal Resistance Network Method. Elsevier.

MLA (9th ed.) Citation

Zhang, Xiaoyue, et al. Rapid Analysis of Temperature Fields in Electronic Enclosures Based on the Finite Difference Thermal Resistance Network Method. Elsevier.