Ji, H., Hwang, I., Kim, J., Lee, S., & Lee, W. Leveraging feature extraction and risk-based clustering for advanced fault diagnosis in equipment. Public Library of Science (PLoS).
Chicago Style (17th ed.) CitationJi, Hyeonbin, Ingeun Hwang, Junghwon Kim, Suan Lee, and Wookey Lee. Leveraging Feature Extraction and Risk-based Clustering for Advanced Fault Diagnosis in Equipment. Public Library of Science (PLoS).
MLA (9th ed.) CitationJi, Hyeonbin, et al. Leveraging Feature Extraction and Risk-based Clustering for Advanced Fault Diagnosis in Equipment. Public Library of Science (PLoS).
Warning: These citations may not always be 100% accurate.