Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals

Since their discovery in 1981, quasicrystals have challenged traditional crystallography, showcasing the diversity of material structures. Quasicrystals are ordered structures in higher-dimensional Cartesian coordinate systems projected into lower dimensions. Exploring whether materials can grow int...

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Main Authors: Bo Da, Long Cheng, Xun Liu, Kunji Shigeto, Zihang Zhang, Kazuhito Tsukagoshi, Toshihide Nabatame, Zejun Ding, Jiangwei Liu, Hideki Yoshikawa, Shigeo Tanuma
Format: Article
Language:English
Published: Taylor & Francis Group 2024-12-01
Series:Science and Technology of Advanced Materials: Methods
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Online Access:https://www.tandfonline.com/doi/10.1080/27660400.2024.2406743
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author Bo Da
Long Cheng
Xun Liu
Kunji Shigeto
Zihang Zhang
Kazuhito Tsukagoshi
Toshihide Nabatame
Zejun Ding
Jiangwei Liu
Hideki Yoshikawa
Shigeo Tanuma
author_facet Bo Da
Long Cheng
Xun Liu
Kunji Shigeto
Zihang Zhang
Kazuhito Tsukagoshi
Toshihide Nabatame
Zejun Ding
Jiangwei Liu
Hideki Yoshikawa
Shigeo Tanuma
author_sort Bo Da
collection DOAJ
description Since their discovery in 1981, quasicrystals have challenged traditional crystallography, showcasing the diversity of material structures. Quasicrystals are ordered structures in higher-dimensional Cartesian coordinate systems projected into lower dimensions. Exploring whether materials can grow into high-symmetry ordered structures in different mathematical coordinate systems is an intriguing topic. This paper reports a new crystallization growth mode in InSiO thin films, exhibiting high symmetry in spherical and cylindrical coordinate systems, named cylindrical symmetric rotating crystals (CSRC). These crystals show rotational symmetry in their lattice structure, consistent with cylindrical symmetry. They are also part of spherical crystals, which theoretically have one of the highest symmetries. Theoretical predictions suggest that a two-dimensional slice of a spherical crystal in conventional grating mode SEM images will display relatively complete Kikuchi patterns due to the wave properties of incident electrons, unlike crystals or quasicrystals, which show surface morphology from the particle properties of incident electrons. We formed InSiO CSRC by heating InSiO amorphous films and observed relatively complete Kikuchi patterns that quantitatively relate to the incident electron beam direction and energy. These findings align with theoretical predictions, indicating that the Kikuchi patterns in SEM images result from Bragg diffraction through coherent electron scattering within the crystals. Quantitative analysis of these patterns provides information on the lattice structure, constants, crystal orientation, stress information, defect concentration, and Brillouin zone of the InSiO material. This method of obtaining microstructural information directly from SEM images applies only to CSRC, not to conventional or quasicrystal samples.
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series Science and Technology of Advanced Materials: Methods
spelling doaj-art-e6a66543e26a4558a179bce6d24cbe6a2024-12-10T09:58:05ZengTaylor & Francis GroupScience and Technology of Advanced Materials: Methods2766-04002024-12-014110.1080/27660400.2024.2406743Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystalsBo Da0Long Cheng1Xun Liu2Kunji Shigeto3Zihang Zhang4Kazuhito Tsukagoshi5Toshihide Nabatame6Zejun Ding7Jiangwei Liu8Hideki Yoshikawa9Shigeo Tanuma10Center for Basic Research on Materials, National Institute for Materials Science, Tsukuba, Ibaraki, JapanDepartment of Physics, University of Science and Technology of China, Hefei, Auhui, P.R. ChinaCenter for Basic Research on Materials, National Institute for Materials Science, Tsukuba, Ibaraki, JapanElectron Microscope Systems Design Department, Hitachi High-Tech Corporation, Hitachinaka, Ibaraki, JapanDepartment of Physics, University of Science and Technology of China, Hefei, Auhui, P.R. ChinaInternational Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, Tsukuba, Ibaraki, JapanInternational Center for Materials Nanoarchitectonics (WPI-MANA), National Institute for Materials Science, Tsukuba, Ibaraki, JapanDepartment of Physics, University of Science and Technology of China, Hefei, Auhui, P.R. ChinaResearch Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, Ibaraki, JapanCenter for Basic Research on Materials, National Institute for Materials Science, Tsukuba, Ibaraki, JapanResearch Network and Facility Services Division, National Institute for Materials Science, Tsukuba, Ibaraki, JapanSince their discovery in 1981, quasicrystals have challenged traditional crystallography, showcasing the diversity of material structures. Quasicrystals are ordered structures in higher-dimensional Cartesian coordinate systems projected into lower dimensions. Exploring whether materials can grow into high-symmetry ordered structures in different mathematical coordinate systems is an intriguing topic. This paper reports a new crystallization growth mode in InSiO thin films, exhibiting high symmetry in spherical and cylindrical coordinate systems, named cylindrical symmetric rotating crystals (CSRC). These crystals show rotational symmetry in their lattice structure, consistent with cylindrical symmetry. They are also part of spherical crystals, which theoretically have one of the highest symmetries. Theoretical predictions suggest that a two-dimensional slice of a spherical crystal in conventional grating mode SEM images will display relatively complete Kikuchi patterns due to the wave properties of incident electrons, unlike crystals or quasicrystals, which show surface morphology from the particle properties of incident electrons. We formed InSiO CSRC by heating InSiO amorphous films and observed relatively complete Kikuchi patterns that quantitatively relate to the incident electron beam direction and energy. These findings align with theoretical predictions, indicating that the Kikuchi patterns in SEM images result from Bragg diffraction through coherent electron scattering within the crystals. Quantitative analysis of these patterns provides information on the lattice structure, constants, crystal orientation, stress information, defect concentration, and Brillouin zone of the InSiO material. This method of obtaining microstructural information directly from SEM images applies only to CSRC, not to conventional or quasicrystal samples.https://www.tandfonline.com/doi/10.1080/27660400.2024.2406743InSiOcylindrically symmetric-rotating crystalKikuchi patternelectron diffractionSEM
spellingShingle Bo Da
Long Cheng
Xun Liu
Kunji Shigeto
Zihang Zhang
Kazuhito Tsukagoshi
Toshihide Nabatame
Zejun Ding
Jiangwei Liu
Hideki Yoshikawa
Shigeo Tanuma
Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals
Science and Technology of Advanced Materials: Methods
InSiO
cylindrically symmetric-rotating crystal
Kikuchi pattern
electron diffraction
SEM
title Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals
title_full Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals
title_fullStr Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals
title_full_unstemmed Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals
title_short Exploring high-symmetry structures in non-Cartesian coordinates: preparation and characteristics of cylindrically symmetric-rotating crystals
title_sort exploring high symmetry structures in non cartesian coordinates preparation and characteristics of cylindrically symmetric rotating crystals
topic InSiO
cylindrically symmetric-rotating crystal
Kikuchi pattern
electron diffraction
SEM
url https://www.tandfonline.com/doi/10.1080/27660400.2024.2406743
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