Jílek, Z., Radlička, T., & Krzyžánek, V. Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM. MDPI AG.
Chicago Style (17th ed.) CitationJílek, Zvonimír, Tomáš Radlička, and Vladislav Krzyžánek. Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM. MDPI AG.
MLA (9th ed.) CitationJílek, Zvonimír, et al. Simulation Study of Low-Dose 4D-STEM Phase Contrast Techniques at the Nanoscale in SEM. MDPI AG.
Warning: These citations may not always be 100% accurate.