Direct Current to Digital Converter (DIDC): A Current Sensor
This paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high p...
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| Format: | Article |
| Language: | English |
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MDPI AG
2024-10-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/24/21/6789 |
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| author | Saeid Karimpour Michael Sekyere Isaac Bruce Emmanuel Nti Darko Degang Chen Colin C. McAndrew Doug Garrity Xiankun Jin Ilhan Hatirnaz Chen He |
| author_facet | Saeid Karimpour Michael Sekyere Isaac Bruce Emmanuel Nti Darko Degang Chen Colin C. McAndrew Doug Garrity Xiankun Jin Ilhan Hatirnaz Chen He |
| author_sort | Saeid Karimpour |
| collection | DOAJ |
| description | This paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high power consumption, large area requirements, and the need for intermediate analog signals. By incorporating a current mirror in a cascode topology and managing the current across multiple binary-sized branches with the Successive Approximation Register (SAR) logic, the design achieves precise current measurement. A simple comparator, coupled with an isolation circuit, ensures accurate and reliable sensing. Fabricated using the TSMC 180 nm process, the DIDC achieves 8-bit precision without the need for nonlinearity calibration, showcasing remarkable energy efficiency with an energy per conversion of 1.52 pJ, power consumption of 117 µW, and a compact area of 0.016 mm². This innovative approach not only reduces power consumption and area, but also provides a scalable and efficient solution for next-generation semiconductor technologies. The ability to conduct online measurements during both standard operations and in-field conditions significantly enhances the performance and reliability of SoCs, making this DIDC a promising advancement in the field. |
| format | Article |
| id | doaj-art-e1bfdcdda8c245a29de180c1c9f0c5b2 |
| institution | Kabale University |
| issn | 1424-8220 |
| language | English |
| publishDate | 2024-10-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Sensors |
| spelling | doaj-art-e1bfdcdda8c245a29de180c1c9f0c5b22024-11-08T14:40:57ZengMDPI AGSensors1424-82202024-10-012421678910.3390/s24216789Direct Current to Digital Converter (DIDC): A Current SensorSaeid Karimpour0Michael Sekyere1Isaac Bruce2Emmanuel Nti Darko3Degang Chen4Colin C. McAndrew5Doug Garrity6Xiankun Jin7Ilhan Hatirnaz8Chen He9Department of Electrical and Computer Engineering (ECpE), Iowa State University, Ames, IA 50011, USADepartment of Electrical and Computer Engineering (ECpE), Iowa State University, Ames, IA 50011, USADepartment of Electrical and Computer Engineering (ECpE), Iowa State University, Ames, IA 50011, USADepartment of Electrical and Computer Engineering (ECpE), Iowa State University, Ames, IA 50011, USADepartment of Electrical and Computer Engineering (ECpE), Iowa State University, Ames, IA 50011, USANXP Semiconductors, Chandler, AZ 85224, USANXP Semiconductors, Chandler, AZ 85224, USANXP Semiconductors, Chandler, AZ 85224, USANXP Semiconductors, Chandler, AZ 85224, USANXP Semiconductors, Chandler, AZ 85224, USAThis paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high power consumption, large area requirements, and the need for intermediate analog signals. By incorporating a current mirror in a cascode topology and managing the current across multiple binary-sized branches with the Successive Approximation Register (SAR) logic, the design achieves precise current measurement. A simple comparator, coupled with an isolation circuit, ensures accurate and reliable sensing. Fabricated using the TSMC 180 nm process, the DIDC achieves 8-bit precision without the need for nonlinearity calibration, showcasing remarkable energy efficiency with an energy per conversion of 1.52 pJ, power consumption of 117 µW, and a compact area of 0.016 mm². This innovative approach not only reduces power consumption and area, but also provides a scalable and efficient solution for next-generation semiconductor technologies. The ability to conduct online measurements during both standard operations and in-field conditions significantly enhances the performance and reliability of SoCs, making this DIDC a promising advancement in the field.https://www.mdpi.com/1424-8220/24/21/6789reliabilitymeasurementADCDIDCCMOSVLSI |
| spellingShingle | Saeid Karimpour Michael Sekyere Isaac Bruce Emmanuel Nti Darko Degang Chen Colin C. McAndrew Doug Garrity Xiankun Jin Ilhan Hatirnaz Chen He Direct Current to Digital Converter (DIDC): A Current Sensor Sensors reliability measurement ADC DIDC CMOS VLSI |
| title | Direct Current to Digital Converter (DIDC): A Current Sensor |
| title_full | Direct Current to Digital Converter (DIDC): A Current Sensor |
| title_fullStr | Direct Current to Digital Converter (DIDC): A Current Sensor |
| title_full_unstemmed | Direct Current to Digital Converter (DIDC): A Current Sensor |
| title_short | Direct Current to Digital Converter (DIDC): A Current Sensor |
| title_sort | direct current to digital converter didc a current sensor |
| topic | reliability measurement ADC DIDC CMOS VLSI |
| url | https://www.mdpi.com/1424-8220/24/21/6789 |
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