Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree

Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree

Negative Ion Source Neutral beam Injection (NNBI), as a critical auxiliary heating system for magnetic confinement fusion devices, directly affects the plasma heating efficiency of tokamak devices through the reliability of its beam source system. The single-shot experiment constitutes a significant...

Full description

Saved in:
Bibliographic Details
Main Authors: Qian Cao, Lizhen Liang
Format: Article
Language:English
Published: MDPI AG 2025-08-01
Series:Applied Sciences
Subjects:
beam source system
FTA
F-V importance measure
failure rate
reliability analysis
negative ion source
Online Access:https://www.mdpi.com/2076-3417/15/15/8556
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items