Hard X-ray single-shot spectrometer of PAL-XFEL
A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of...
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| Format: | Article |
| Language: | English |
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International Union of Crystallography
2025-01-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S1600577524009779 |
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| author | Sangsoo Kim Jae Hyuk Lee Daewoong Nam Gisu Park Myong-jin Kim Intae Eom Inhyuk Nam Chi Hyun Shim Jangwoo Kim |
| author_facet | Sangsoo Kim Jae Hyuk Lee Daewoong Nam Gisu Park Myong-jin Kim Intae Eom Inhyuk Nam Chi Hyun Shim Jangwoo Kim |
| author_sort | Sangsoo Kim |
| collection | DOAJ |
| description | A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of 100 mm. Depending on the photon energy range, either the Si (111) or Si (110) crystal can be selected for spectral analysis. Especially in the energy range 4.5–17 keV, the spectrometer is designed to cover a spectral range wider than the full free-electron laser bandwidth and to guarantee a high resolution sufficient for resolving each spectral spike. This paper presents the design specifications, instruments and performance of this spectrometer, which has also been applied to demonstrate the spectral properties of various XFEL sources, such as self-amplified spontaneous emission, monochromatic and seeded beams. |
| format | Article |
| id | doaj-art-e1261629b28e48fe93781857e0a2ff66 |
| institution | Kabale University |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-e1261629b28e48fe93781857e0a2ff662025-01-07T14:26:38ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-01-0132124625310.1107/S1600577524009779yi5163Hard X-ray single-shot spectrometer of PAL-XFELSangsoo Kim0Jae Hyuk Lee1Daewoong Nam2Gisu Park3Myong-jin Kim4Intae Eom5Inhyuk Nam6Chi Hyun Shim7Jangwoo Kim8Pohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaPohang Accelerator Laboratory/POSTECH, 80 Jigokro-127-beongil, Pohang, Gyeongbuk 37673, Republic of KoreaA transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of 100 mm. Depending on the photon energy range, either the Si (111) or Si (110) crystal can be selected for spectral analysis. Especially in the energy range 4.5–17 keV, the spectrometer is designed to cover a spectral range wider than the full free-electron laser bandwidth and to guarantee a high resolution sufficient for resolving each spectral spike. This paper presents the design specifications, instruments and performance of this spectrometer, which has also been applied to demonstrate the spectral properties of various XFEL sources, such as self-amplified spontaneous emission, monochromatic and seeded beams.https://journals.iucr.org/paper?S1600577524009779xfelspectrometerpal-xfel |
| spellingShingle | Sangsoo Kim Jae Hyuk Lee Daewoong Nam Gisu Park Myong-jin Kim Intae Eom Inhyuk Nam Chi Hyun Shim Jangwoo Kim Hard X-ray single-shot spectrometer of PAL-XFEL Journal of Synchrotron Radiation xfel spectrometer pal-xfel |
| title | Hard X-ray single-shot spectrometer of PAL-XFEL |
| title_full | Hard X-ray single-shot spectrometer of PAL-XFEL |
| title_fullStr | Hard X-ray single-shot spectrometer of PAL-XFEL |
| title_full_unstemmed | Hard X-ray single-shot spectrometer of PAL-XFEL |
| title_short | Hard X-ray single-shot spectrometer of PAL-XFEL |
| title_sort | hard x ray single shot spectrometer of pal xfel |
| topic | xfel spectrometer pal-xfel |
| url | https://journals.iucr.org/paper?S1600577524009779 |
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