Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-02-01
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| Series: | Case Studies in Thermal Engineering |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2214157X25000504 |
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