APA (7th ed.) Citation

Basol, B. M., & Joshi, A. Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers. MDPI AG.

Chicago Style (17th ed.) Citation

Basol, Bulent M., and Abhijeet Joshi. Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers. MDPI AG.

MLA (9th ed.) Citation

Basol, Bulent M., and Abhijeet Joshi. Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers. MDPI AG.

Warning: These citations may not always be 100% accurate.