A lightweight fabric defect detection with parallel dilated convolution and dual attention mechanism
Detecting defects in fabrics is essential to quality control in the manufacturing process of textile productions. To increase detection efficiency, a variety of automatic fabric defect detections have been developed. However, most of these methods rely on complex model with heavy parameters, leading...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
PeerJ Inc.
2025-08-01
|
| Series: | PeerJ Computer Science |
| Subjects: | |
| Online Access: | https://peerj.com/articles/cs-3136.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|