Calculation of rf-induced temporal jitter in ultrafast electron diffraction
A significant contribution to the temporal resolution of an ultrafast electron diffraction (UED) instrument is arrival time jitter caused by amplitude and phase variation of radio-frequency (rf) cavities. In this paper, we present a semianalytical approach for calculating rf-induced temporal jitter...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2025-02-01
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| Series: | Physical Review Accelerators and Beams |
| Online Access: | http://doi.org/10.1103/PhysRevAccelBeams.28.024001 |
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