APA (7th ed.) Citation

Kumar, P., Shim, D. E., Narla, S., & Naeemi, A. Impact of Technology Scaling and Back-End-of-the-Line Technology Solutions on Magnetic Random-Access Memories. IEEE.

Chicago Style (17th ed.) Citation

Kumar, Piyush, Da Eun Shim, Siri Narla, and Azad Naeemi. Impact of Technology Scaling and Back-End-of-the-Line Technology Solutions on Magnetic Random-Access Memories. IEEE.

MLA (9th ed.) Citation

Kumar, Piyush, et al. Impact of Technology Scaling and Back-End-of-the-Line Technology Solutions on Magnetic Random-Access Memories. IEEE.