APA (7th ed.) Citation

Gao, T., He, D., Xu, Z., Wei, J., Xie, S., Teyssède, G., . . . Cui, B. Degradation induced by charge relaxation in silicone gels under the ultra‐fast pulsed electric field. Wiley.

Chicago Style (17th ed.) Citation

Gao, Teng, Dongxin He, Zhe Xu, Junyu Wei, Shijie Xie, Gilbert Teyssède, Zhizhen Liu, and Bin Cui. Degradation Induced by Charge Relaxation in Silicone Gels Under the Ultra‐fast Pulsed Electric Field. Wiley.

MLA (9th ed.) Citation

Gao, Teng, et al. Degradation Induced by Charge Relaxation in Silicone Gels Under the Ultra‐fast Pulsed Electric Field. Wiley.