In situ high-resolution cryo-EM reconstructions from CEMOVIS

In situ high-resolution cryo-EM reconstructions from CEMOVIS

Cryo-electron microscopy can be used to image cells and tissue at high resolution. To ensure electron transparency, the sample thickness must not exceed 500 nm. Focused-ion-beam (FIB) milling has become the standard method for preparing thin samples (lamellae); however, the material removed by the m...

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Bibliographic Details
Main Authors: Johannes Elferich, Marek Kaminek, Lingli Kong, Adolfo Odriozola, Wanda Kukulski, Benoît Zuber, Nikolaus Grigorieff
Format: Article
Language:English
Published: International Union of Crystallography 2025-07-01
Series:IUCrJ
Subjects:
electron tomography
integrative structural biology
imaging
structure determination
cryo-electron microscopy
Online Access:https://journals.iucr.org/paper?S2052252525005196
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