Cho, Y., Kim, Y., & Kwon, M. Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines. MDPI AG.
Chicago Style (17th ed.) CitationCho, Yeongmyeong, Yeon-Seok Kim, and Min-Woo Kwon. Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines. MDPI AG.
MLA (9th ed.) CitationCho, Yeongmyeong, et al. Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines. MDPI AG.
Warning: These citations may not always be 100% accurate.