Broadband metamaterial polarizers with high extinction ratio for high-precision terahertz spectroscopic polarimetry
The demand for precise polarizers is increasing to investigate the polarization characteristics of materials non-invasively in the terahertz region. Recently, to address the low extinction ratio and fragile nature of conventional wire-grid polarizers, plasmonic structures and metasurfaces have been...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2024-11-01
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| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/5.0228119 |
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| Summary: | The demand for precise polarizers is increasing to investigate the polarization characteristics of materials non-invasively in the terahertz region. Recently, to address the low extinction ratio and fragile nature of conventional wire-grid polarizers, plasmonic structures and metasurfaces have been proposed. However, the challenge of achieving low transmittance compared to a high extinction ratio, along with the bulky structure due to a thick substrate, remains to be addressed. Here, we present high-efficiency broadband metamaterial polarizers consisting of cross-aligned double-layers of subwavelength metallic slit arrays, leveraging the extraordinary optical transmission and funneling effects. We obtained extinction ratios exceeding 70 dB over a broad frequency range, from 0.2 to 2.5 THz, reaching a maximum extinction ratio of ∼90 dB at 0.7 THz. To investigate the influence of high extinction ratio polarizers on actual measurement results, we measured a non-Hermitian metasurface with asymmetric polarization conversion and analyzed them using the Jones matrix formalism. The results confirmed that the extinction ratio of the polarizer has a significant impact on precise polarization-dependent measurements, especially on cross-polarization measurements. The enhanced performance of our polarizers offers significant potential for sensitive THz systems, paving the way for advancements in polarization analysis of emerging materials and chiral sensing. |
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| ISSN: | 2378-0967 |