Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section

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Bibliographic Details
Main Authors: James A. Smith, Helena Geirinhas Ramos
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Open Journal of Instrumentation and Measurement
Online Access:https://ieeexplore.ieee.org/document/10815015/
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author James A. Smith
Helena Geirinhas Ramos
author_facet James A. Smith
Helena Geirinhas Ramos
author_sort James A. Smith
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institution Kabale University
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series IEEE Open Journal of Instrumentation and Measurement
spelling doaj-art-bce9cc0228894b4cb34f010e6c2705ce2025-01-15T00:04:27ZengIEEEIEEE Open Journal of Instrumentation and Measurement2768-72362024-01-0131310.1109/OJIM.2024.350627210815015Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special SectionJames A. Smith0https://orcid.org/0000-0002-4450-8573Helena Geirinhas Ramos1Measurement Sciences Idaho National Laboratory, Idaho Falls, ID, USAInstituto Superior Técnico, Universidade de Lisboa, Lisbon, Portugalhttps://ieeexplore.ieee.org/document/10815015/
spellingShingle James A. Smith
Helena Geirinhas Ramos
Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section
IEEE Open Journal of Instrumentation and Measurement
title Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section
title_full Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section
title_fullStr Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section
title_full_unstemmed Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section
title_short Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section
title_sort guest editorial for nondestructive testing and evaluation ndt x0026 e special section
url https://ieeexplore.ieee.org/document/10815015/
work_keys_str_mv AT jamesasmith guesteditorialfornondestructivetestingandevaluationndtx0026especialsection
AT helenageirinhasramos guesteditorialfornondestructivetestingandevaluationndtx0026especialsection