The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II
X-ray fluorescence (XRF) is widely used to analyze elemental distributions in samples. Micro-XRF (µ-XRF), the most basic conventional XRF technique, offers good spatial resolution through precise 2D scanning with a micrometre-sized X-ray source. Recently, synchrotron based XRF analysis platforms hav...
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| Language: | English |
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International Union of Crystallography
2025-01-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S1600577524011111 |
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| author | Min Woo Kim Kangwoo Ahn Chang Hun Lee Tae Joo Kim JongYul Kim Min-Su Han Hyeong Uk Mo Jina Kim Hyun Wook Park Ho Jae Kwak Jong Hyun Kim |
| author_facet | Min Woo Kim Kangwoo Ahn Chang Hun Lee Tae Joo Kim JongYul Kim Min-Su Han Hyeong Uk Mo Jina Kim Hyun Wook Park Ho Jae Kwak Jong Hyun Kim |
| author_sort | Min Woo Kim |
| collection | DOAJ |
| description | X-ray fluorescence (XRF) is widely used to analyze elemental distributions in samples. Micro-XRF (µ-XRF), the most basic conventional XRF technique, offers good spatial resolution through precise 2D scanning with a micrometre-sized X-ray source. Recently, synchrotron based XRF analysis platforms have achieved nano-XRF with highly focused X-rays using polycapillary optics or mirrors, leveraging the excellent coherence of synchrotron radiation. However, XRF techniques are hindered by long data acquisition times (exceeding several hours) due to their point-by-point scanning approach, impeding large-area elemental mapping. Full-field XRF (FF-XRF), developed in the 2010s and based on the high brilliance of synchrotron X-rays, enables significantly shorter (less than a few minutes) data acquisition times via single-exposure imaging using a 2D X-ray detector. Nevertheless, it is constrained by relatively low spatial resolution and sensitivity. Hence, a new XRF platform is required to accommodate resolution demands to cover diverse experimental purposes. In this study, we developed a preliminary model of a novel XRF system that combines micro- and full-field XRF setups to address these limitations. This system allows easy mode switching while maintaining the region of interest of the imaging system within a single apparatus, simply by rotating the sample to face either detector depending on research purposes. We anticipate that this new XRF system will be widely utilized in various research fields as the initial XRF setup at Pohang Light Source-II. |
| format | Article |
| id | doaj-art-bc2ead7660734e85b3d3f1140577f7f0 |
| institution | Kabale University |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-bc2ead7660734e85b3d3f1140577f7f02025-01-07T14:26:38ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-01-0132125426010.1107/S1600577524011111vy5034The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-IIMin Woo Kim0Kangwoo Ahn1Chang Hun Lee2Tae Joo Kim3JongYul Kim4Min-Su Han5Hyeong Uk Mo6Jina Kim7Hyun Wook Park8Ho Jae Kwak9Jong Hyun Kim10Pohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaPohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaPohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaNeutron Science Division, Korean Atomic Energy Research Institute, Daejeon 34057, Republic of KoreaNeutron Science Division, Korean Atomic Energy Research Institute, Daejeon 34057, Republic of KoreaKorea National University of Heritage, Buyeo 33115, Republic of KoreaPohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaPohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaDepartment of Physics, Kyungpook National University, Daegu 41566, Republic of KoreaPohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaPohang Accelerator Laboratory (PAL), POSTECH, Pohang 37673, Republic of KoreaX-ray fluorescence (XRF) is widely used to analyze elemental distributions in samples. Micro-XRF (µ-XRF), the most basic conventional XRF technique, offers good spatial resolution through precise 2D scanning with a micrometre-sized X-ray source. Recently, synchrotron based XRF analysis platforms have achieved nano-XRF with highly focused X-rays using polycapillary optics or mirrors, leveraging the excellent coherence of synchrotron radiation. However, XRF techniques are hindered by long data acquisition times (exceeding several hours) due to their point-by-point scanning approach, impeding large-area elemental mapping. Full-field XRF (FF-XRF), developed in the 2010s and based on the high brilliance of synchrotron X-rays, enables significantly shorter (less than a few minutes) data acquisition times via single-exposure imaging using a 2D X-ray detector. Nevertheless, it is constrained by relatively low spatial resolution and sensitivity. Hence, a new XRF platform is required to accommodate resolution demands to cover diverse experimental purposes. In this study, we developed a preliminary model of a novel XRF system that combines micro- and full-field XRF setups to address these limitations. This system allows easy mode switching while maintaining the region of interest of the imaging system within a single apparatus, simply by rotating the sample to face either detector depending on research purposes. We anticipate that this new XRF system will be widely utilized in various research fields as the initial XRF setup at Pohang Light Source-II.https://journals.iucr.org/paper?S1600577524011111full-field x-ray fluorescenceff-xrfmicro-xrfµ-xrfsynchrotron x-rayssingle-exposure imaging2d x-ray detector |
| spellingShingle | Min Woo Kim Kangwoo Ahn Chang Hun Lee Tae Joo Kim JongYul Kim Min-Su Han Hyeong Uk Mo Jina Kim Hyun Wook Park Ho Jae Kwak Jong Hyun Kim The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II Journal of Synchrotron Radiation full-field x-ray fluorescence ff-xrf micro-xrf µ-xrf synchrotron x-rays single-exposure imaging 2d x-ray detector |
| title | The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II |
| title_full | The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II |
| title_fullStr | The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II |
| title_full_unstemmed | The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II |
| title_short | The early development of a combined micro- and full-field X-ray fluorescence analysis system using white X-rays at PLS-II |
| title_sort | early development of a combined micro and full field x ray fluorescence analysis system using white x rays at pls ii |
| topic | full-field x-ray fluorescence ff-xrf micro-xrf µ-xrf synchrotron x-rays single-exposure imaging 2d x-ray detector |
| url | https://journals.iucr.org/paper?S1600577524011111 |
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