Unsupervised and Semisupervised Machine Learning Frameworks for Multiclass Tool Wear Recognition
Tool condition monitoring (TCM) is crucial to ensure good quality products and avoid downtime. Machine learning has proven to be vital for TCM. However, existing works are predominately based on supervised learning, which hinders their applicability in real-world manufacturing settings, where data l...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Open Journal of the Industrial Electronics Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10668405/ |
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