TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS
Construction techniques of precision measuring instruments of optical characteristics on the basis of two-wave lasers with use of basic and nephelometer methods are presented. System stability to changes of hardware constants, influence of an environment, pollution of optics is shown. The system aut...
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Main Authors: | V. L. Kozlov, M. M. Kygeiko |
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Format: | Article |
Language: | English |
Published: |
Belarusian National Technical University
2015-04-01
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Series: | Приборы и методы измерений |
Subjects: | |
Online Access: | https://pimi.bntu.by/jour/article/view/132 |
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