Shi, B., You, H., & Wang, H. A Dynamic Measurement System Based on Adaptive Clustering and Multi-Classifier. MDPI AG.
Chicago Style (17th ed.) CitationShi, Bowen, Hongjian You, and Huixian Wang. A Dynamic Measurement System Based on Adaptive Clustering and Multi-Classifier. MDPI AG.
MLA (9th ed.) CitationShi, Bowen, et al. A Dynamic Measurement System Based on Adaptive Clustering and Multi-Classifier. MDPI AG.
Warning: These citations may not always be 100% accurate.