APA (7th ed.) Citation

Jo, U., & Kim, S. B. Semi-Supervised Learning With Wafer-Specific Augmentations for Wafer Defect Classification. IEEE.

Chicago Style (17th ed.) Citation

Jo, Uk, and Seoung Bum Kim. Semi-Supervised Learning With Wafer-Specific Augmentations for Wafer Defect Classification. IEEE.

MLA (9th ed.) Citation

Jo, Uk, and Seoung Bum Kim. Semi-Supervised Learning With Wafer-Specific Augmentations for Wafer Defect Classification. IEEE.

Warning: These citations may not always be 100% accurate.