Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions

The characterisation of photovoltaic modules requires a specialised laboratory that guarantees precise control of irradiance and its spectrum and control of the module temperature during testing. As an alternative, characteristic parameters can be extracted from the measurements of the current-volta...

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Main Authors: Slawomir Gulkowski, Ewelina Krawczak
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Energies
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Online Access:https://www.mdpi.com/1996-1073/17/23/5853
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author Slawomir Gulkowski
Ewelina Krawczak
author_facet Slawomir Gulkowski
Ewelina Krawczak
author_sort Slawomir Gulkowski
collection DOAJ
description The characterisation of photovoltaic modules requires a specialised laboratory that guarantees precise control of irradiance and its spectrum and control of the module temperature during testing. As an alternative, characteristic parameters can be extracted from the measurements of the current-voltage characteristics (<i>I-V</i> curves) carried out under outdoor conditions. This paper presents the results of the two commercial thin-film photovoltaic modules’ characterisation. The first analysed device was a cadmium telluride (CdTe) photovoltaic module fabricated on glass, while the second was the flexible copper indium gallium diselenide (CIGS) PV module. The main parameters of the PV modules were extracted based on the series of <i>I-V</i> curve measurements under real operating conditions in Poland with the use of the capacitor-based <i>I-V</i> tracer. Solar radiation together with the modules’ temperature were registered simultaneously with the <i>I-V</i> characterisation. Two approaches were proposed to estimate the main PV parameters at standard test conditions as output power, short circuit current or open circuit voltage. The difference in results of power for both approaches was below 1.5%. Energy, computed using the Osterwald model, was compared with the experimental measurements. The best results of absolute relative error (ARE) were found around 0.5% for both technologies. The lowest value of root mean squared error (RMSE) was 1.3% in terms of CdTe technology and 3.1% for CIGS.
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spelling doaj-art-ac2e2a7dba51456abf6d8523ac2de92b2024-12-13T16:25:08ZengMDPI AGEnergies1996-10732024-11-011723585310.3390/en17235853Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor ConditionsSlawomir Gulkowski0Ewelina Krawczak1Department of Renewable Energy Engineering, Faculty of Environmental Engineering, Lublin University of Technology, Nadbystrzycka 40B, 20-618 Lublin, PolandDepartment of Renewable Energy Engineering, Faculty of Environmental Engineering, Lublin University of Technology, Nadbystrzycka 40B, 20-618 Lublin, PolandThe characterisation of photovoltaic modules requires a specialised laboratory that guarantees precise control of irradiance and its spectrum and control of the module temperature during testing. As an alternative, characteristic parameters can be extracted from the measurements of the current-voltage characteristics (<i>I-V</i> curves) carried out under outdoor conditions. This paper presents the results of the two commercial thin-film photovoltaic modules’ characterisation. The first analysed device was a cadmium telluride (CdTe) photovoltaic module fabricated on glass, while the second was the flexible copper indium gallium diselenide (CIGS) PV module. The main parameters of the PV modules were extracted based on the series of <i>I-V</i> curve measurements under real operating conditions in Poland with the use of the capacitor-based <i>I-V</i> tracer. Solar radiation together with the modules’ temperature were registered simultaneously with the <i>I-V</i> characterisation. Two approaches were proposed to estimate the main PV parameters at standard test conditions as output power, short circuit current or open circuit voltage. The difference in results of power for both approaches was below 1.5%. Energy, computed using the Osterwald model, was compared with the experimental measurements. The best results of absolute relative error (ARE) were found around 0.5% for both technologies. The lowest value of root mean squared error (RMSE) was 1.3% in terms of CdTe technology and 3.1% for CIGS.https://www.mdpi.com/1996-1073/17/23/5853photovoltaic systemthin-film photovoltaics<i>I-V</i> characteristic measurementsoutdoor performancebuilding integrated photovoltaics
spellingShingle Slawomir Gulkowski
Ewelina Krawczak
Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions
Energies
photovoltaic system
thin-film photovoltaics
<i>I-V</i> characteristic measurements
outdoor performance
building integrated photovoltaics
title Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions
title_full Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions
title_fullStr Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions
title_full_unstemmed Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions
title_short Thin-Film Photovoltaic Modules Characterisation Based on <i>I-V</i> Measurements Under Outdoor Conditions
title_sort thin film photovoltaic modules characterisation based on i i v i measurements under outdoor conditions
topic photovoltaic system
thin-film photovoltaics
<i>I-V</i> characteristic measurements
outdoor performance
building integrated photovoltaics
url https://www.mdpi.com/1996-1073/17/23/5853
work_keys_str_mv AT slawomirgulkowski thinfilmphotovoltaicmodulescharacterisationbasedoniivimeasurementsunderoutdoorconditions
AT ewelinakrawczak thinfilmphotovoltaicmodulescharacterisationbasedoniivimeasurementsunderoutdoorconditions