Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers
The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO2 glas...
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| Language: | English |
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International Union of Crystallography
2025-01-01
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| Series: | Journal of Synchrotron Radiation |
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| Online Access: | https://journals.iucr.org/paper?S1600577524010634 |
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| author | Nozomu Hiraoka |
| author_facet | Nozomu Hiraoka |
| author_sort | Nozomu Hiraoka |
| collection | DOAJ |
| description | The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO2 glass sample. Widely used, Bragg analyzers display excellent performance at the photon energy E ≤ 10 keV. However, at higher E, the reflectivity and the resolution gradually deteriorate as E increases, showing poor performance above 20 keV. On the other hand, the reflectivity of the Laue analyzer gradually increases at E > 10 keV, displaying excellent reflectivity and good resolution around 20 keV. The Laue analyzer is suitable for X-ray absorption spectroscopy in high-energy-resolution fluorescence-detection mode or X-ray emission spectroscopy on 4d transition metal compounds. Furthermore, the X-ray Raman features of the lithium K-edge in LiF and the oxygen K-edge feature in H2O, measured by nine Bragg analyzers (2 m radius) at E ≃ 9.9 keV and by five Laue analyzers (1.4 m radius) at E ≃ 19.5 keV, have been compared. Similar count rates and resolutions are observed. |
| format | Article |
| id | doaj-art-a82b6329f95d43258776b50b64f10f7c |
| institution | Kabale University |
| issn | 1600-5775 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | Journal of Synchrotron Radiation |
| spelling | doaj-art-a82b6329f95d43258776b50b64f10f7c2025-01-07T14:26:38ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-01-0132110911710.1107/S1600577524010634ye5053Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzersNozomu Hiraoka0National Synchrotron Radiation Research Center, Hsinchu 30076, TaiwanThe performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO2 glass sample. Widely used, Bragg analyzers display excellent performance at the photon energy E ≤ 10 keV. However, at higher E, the reflectivity and the resolution gradually deteriorate as E increases, showing poor performance above 20 keV. On the other hand, the reflectivity of the Laue analyzer gradually increases at E > 10 keV, displaying excellent reflectivity and good resolution around 20 keV. The Laue analyzer is suitable for X-ray absorption spectroscopy in high-energy-resolution fluorescence-detection mode or X-ray emission spectroscopy on 4d transition metal compounds. Furthermore, the X-ray Raman features of the lithium K-edge in LiF and the oxygen K-edge feature in H2O, measured by nine Bragg analyzers (2 m radius) at E ≃ 9.9 keV and by five Laue analyzers (1.4 m radius) at E ≃ 19.5 keV, have been compared. Similar count rates and resolutions are observed.https://journals.iucr.org/paper?S1600577524010634x-ray raman scatteringx-ray emission spectroscopylaue analyzersspherically bent bragg analyzerscylindrically bent laue analyzers |
| spellingShingle | Nozomu Hiraoka Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers Journal of Synchrotron Radiation x-ray raman scattering x-ray emission spectroscopy laue analyzers spherically bent bragg analyzers cylindrically bent laue analyzers |
| title | Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers |
| title_full | Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers |
| title_fullStr | Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers |
| title_full_unstemmed | Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers |
| title_short | Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer: performance tests and a comparison with spherically bent Bragg analyzers |
| title_sort | cylindrically bent laue analyzer in an x ray raman emission spectrometer performance tests and a comparison with spherically bent bragg analyzers |
| topic | x-ray raman scattering x-ray emission spectroscopy laue analyzers spherically bent bragg analyzers cylindrically bent laue analyzers |
| url | https://journals.iucr.org/paper?S1600577524010634 |
| work_keys_str_mv | AT nozomuhiraoka cylindricallybentlaueanalyzerinanxrayramanemissionspectrometerperformancetestsandacomparisonwithsphericallybentbragganalyzers |