Leveraging feature extraction and risk-based clustering for advanced fault diagnosis in equipment.
In the contemporary manufacturing landscape, the advent of artificial intelligence and big data analytics has been a game-changer in enhancing product quality. Despite these advancements, their application in diagnosing failure probability and risk remains underexplored. The current practice of fail...
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Main Authors: | Hyeonbin Ji, Ingeun Hwang, Junghwon Kim, Suan Lee, Wookey Lee |
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Format: | Article |
Language: | English |
Published: |
Public Library of Science (PLoS)
2024-01-01
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Series: | PLoS ONE |
Online Access: | https://doi.org/10.1371/journal.pone.0314931 |
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