ZHANG Jie, Z. J. Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties. Editorial Department of Materials Protection.
Chicago Style (17th ed.) CitationZHANG Jie, ZOU Junwen. Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties. Editorial Department of Materials Protection.
MLA (9th ed.) CitationZHANG Jie, ZOU Junwen. Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties. Editorial Department of Materials Protection.
Warning: These citations may not always be 100% accurate.