Hurdle Approach to Simulate Corn Wet Milling Inactivation of Undesirable Microorganisms: A Pilot Scale Microbial Challenge Study Using Salmonella Surrogate Enterococcus faecium

Hurdle Approach to Simulate Corn Wet Milling Inactivation of Undesirable Microorganisms: A Pilot Scale Microbial Challenge Study Using Salmonella Surrogate Enterococcus faecium

Corn wet milling (CWM) and corn starch flash drying processing conditions reduce undesirable microorganisms, such as Salmonella. Finished products are historically safe, with intrinsic properties such as low water activity inhibiting microbial growth. Corn processors could use quantified levels of r...

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Bibliographic Details
Main Authors: Erin Kealey, Madeline Shick, Minho Kim, Ruben Chavez, Gordon Shetley, David Stenger, Kirk A. Perreau, Allison Cooke, Cecil Barnett-Neefs, Matthew J. Stasiewicz
Format: Article
Language:English
Published: Elsevier 2025-01-01
Series:Journal of Food Protection
Subjects:
Corn Starch
Hurdle
Hydrogen peroxide
Ring dryer
Sulfur dioxide
Online Access:http://www.sciencedirect.com/science/article/pii/S0362028X24002163
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