LUO, x., LIU, j., JIANG, p., & CHENG, y. Embedded domain knowledge method for worst-case analysis of three-span beam under multiple patch loads. Editorial Office of Chinese Journal of Ship Research.
Chicago Style (17th ed.) CitationLUO, xiangyun, jun LIU, puyu JIANG, and yuansheng CHENG. Embedded Domain Knowledge Method for Worst-case Analysis of Three-span Beam Under Multiple Patch Loads. Editorial Office of Chinese Journal of Ship Research.
MLA (9th ed.) CitationLUO, xiangyun, et al. Embedded Domain Knowledge Method for Worst-case Analysis of Three-span Beam Under Multiple Patch Loads. Editorial Office of Chinese Journal of Ship Research.
Warning: These citations may not always be 100% accurate.