Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring

This paper presents a comparative study of classical and Bayesian risks in the design of optimal failure-censored sampling plans for lognormal lifetime models. The analysis focuses on how variations in prior distributions, specifically the beta distribution for defect rates, influence the producer’s...

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Main Authors: Huasen Zhou, Wenhao Gui
Format: Article
Language:English
Published: MDPI AG 2025-04-01
Series:Entropy
Subjects:
Online Access:https://www.mdpi.com/1099-4300/27/5/477
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author Huasen Zhou
Wenhao Gui
author_facet Huasen Zhou
Wenhao Gui
author_sort Huasen Zhou
collection DOAJ
description This paper presents a comparative study of classical and Bayesian risks in the design of optimal failure-censored sampling plans for lognormal lifetime models. The analysis focuses on how variations in prior distributions, specifically the beta distribution for defect rates, influence the producer’s and consumer’s risks, along with the optimal sample size. We explore the sensitivity of the sampling plan’s risks to changes in the prior mean and variance, offering insight into the impacts of uncertainty in prior knowledge on sampling efficiency. Classical and Bayesian approaches are evaluated, highlighting the trade-offs between minimizing sample size and controlling risks for both the producer and the consumer. The results demonstrate that Bayesian methods generally provide more robust designs under uncertain prior information, while classical methods exhibit greater sensitivity to parameter changes. A computational procedure for determining the optimal sampling plans is provided, and the outcomes are validated through simulations, showcasing the practical implications for quality control in reliability testing and industrial applications.
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institution Kabale University
issn 1099-4300
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publishDate 2025-04-01
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series Entropy
spelling doaj-art-8d8d1c67853b4c88b5ddb147f9a9d65d2025-08-20T03:47:52ZengMDPI AGEntropy1099-43002025-04-0127547710.3390/e27050477Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II CensoringHuasen Zhou0Wenhao Gui1School of Mathematics and Statistics, Beijing Jiaotong University, Beijing 100044, ChinaSchool of Mathematics and Statistics, Beijing Jiaotong University, Beijing 100044, ChinaThis paper presents a comparative study of classical and Bayesian risks in the design of optimal failure-censored sampling plans for lognormal lifetime models. The analysis focuses on how variations in prior distributions, specifically the beta distribution for defect rates, influence the producer’s and consumer’s risks, along with the optimal sample size. We explore the sensitivity of the sampling plan’s risks to changes in the prior mean and variance, offering insight into the impacts of uncertainty in prior knowledge on sampling efficiency. Classical and Bayesian approaches are evaluated, highlighting the trade-offs between minimizing sample size and controlling risks for both the producer and the consumer. The results demonstrate that Bayesian methods generally provide more robust designs under uncertain prior information, while classical methods exhibit greater sensitivity to parameter changes. A computational procedure for determining the optimal sampling plans is provided, and the outcomes are validated through simulations, showcasing the practical implications for quality control in reliability testing and industrial applications.https://www.mdpi.com/1099-4300/27/5/477reliability testingBayesian samplingfailure-censored samplingType II censoringlognormal distribution
spellingShingle Huasen Zhou
Wenhao Gui
Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring
Entropy
reliability testing
Bayesian sampling
failure-censored sampling
Type II censoring
lognormal distribution
title Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring
title_full Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring
title_fullStr Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring
title_full_unstemmed Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring
title_short Classical Versus Bayesian Error-Controlled Sampling Under Lognormal Distributions with Type II Censoring
title_sort classical versus bayesian error controlled sampling under lognormal distributions with type ii censoring
topic reliability testing
Bayesian sampling
failure-censored sampling
Type II censoring
lognormal distribution
url https://www.mdpi.com/1099-4300/27/5/477
work_keys_str_mv AT huasenzhou classicalversusbayesianerrorcontrolledsamplingunderlognormaldistributionswithtypeiicensoring
AT wenhaogui classicalversusbayesianerrorcontrolledsamplingunderlognormaldistributionswithtypeiicensoring