Kemper, G., Schreuder, R., Schrauwen, R. W., Droste, J. S. T. s., Siersema, P., & Geenen, E. M. v. Endoscopic mucosal resection defect inspection for predicting recurrences: International image-based survey. Georg Thieme Verlag KG.
Chicago Style (17th ed.) CitationKemper, Gijs, Ramon-Michel Schreuder, R. W.M Schrauwen, Jochim S. Terhaar sive Droste, Peter Siersema, and Erwin-Jan M. van Geenen. Endoscopic Mucosal Resection Defect Inspection for Predicting Recurrences: International Image-based Survey. Georg Thieme Verlag KG.
MLA (9th ed.) CitationKemper, Gijs, et al. Endoscopic Mucosal Resection Defect Inspection for Predicting Recurrences: International Image-based Survey. Georg Thieme Verlag KG.
Warning: These citations may not always be 100% accurate.